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Mobile roughness measuring device Waveline W10 measuring range max. 320 µ

Mobile roughness measuring device Waveline W10 measuring range max. 320 µ

Mobile roughness measuring device Waveline W10 measuring range max. 320 µ
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Item no: 1033925 101 

Online price:

Available in 11-13 working days.

Application
Compact, mobile roughness measuring device for standardised roughness measurement in production and in measuring rooms.

Execution
  • Charging cradle for feed unit in base unit for continuous availability and secure storage with integrated printer for immediate documentation
  • Intuitive operation via large, colour touchscreen
  • Roughness probe can be replaced easily
  • Immediate inspection of measuring device using built-in roughness standard with reliable measurement allocation
  • Memory holds seven measuring programs with measuring conditions
  • At-a-glance tolerance assessment for immediate evaluation of measurement results
  • USB interface with Windows-compatible data format
  • Wireless data transfer via Bluetooth® interface
  • Precise workpiece support, even for small shafts
  • Probe can be swivelled 90° for measurements on deep surfaces, in grooves, in recesses or between collars

Advantage
  • With optional Evovis software, supports the "latest" roughness standard ISO 21920
  • Measures in all positions, even on vertical surfaces or overhead
  • 40 measurable characteristic variables
  • Transverse probing of surfaces without changing equipment

Delivery
1x Waveline W10 base unit
1x wireless feed unit with axial and transverse probing
2x roughness probes T1E (2 µm/90°) with measuring range +/- 100 µm
2x rolls of printer paper
Roughness standard
Illuminated probe guard
Mains adapter
Factory calibration certificate
Operating instructions
Storage case

Notes
For thermal printer, see art. no. 1033903 101.
For Evovis software, see art. no. 1033910 201-202.
To enlarge the measuring range to +/- 300 µm please use the corresponding probe art. no. 1033903 108

Brand: HOMMEL ETAMIC
Type: Waveline W10
Probe system: Runner probe system
Min./max. scanning path: 1.5-17.5 mm
Surface roughness scanning path: 4,8 mm | 1,5 mm | 17.5 mm
Surface roughness sensing speed: 1 mm/s | 0.5 mm/s | 0.1 mm/s
Parameters: Ra | Rz | Rmax | Rt | Rpc | Rsm | Rc | Rp | Rpm (ASME) | Rv | Rmr | Rq | R3z | Rz (JIS) | Rdc | Rsk | Rdq | Pa | Pz | Pt | MR1 | MR2 | A1 | A2 | Rk | Rpk | Rvk | V0 | VO | R | Ar | CR | CL | Rx | NR (MOTIF) | CF
Threshold wave length: 0.25 mm | 0.8 mm | 2.5 mm
Measurement profile memory (number of profiles): 5 PCS
Measurement profile memory (number of single readings): 10000 PCS
Data transmission type: Bluetooth | Cable

Manufacturer part no.: 10065263

Product Datasheet
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